Academic Staff
Alexander Studt
Profile
I am a PhD student at the TECO research group at the Karlsruhe Institute of Technology (KIT), focusing on machine learning for printed neuromorphic circuits. My research explores how learning algorithms can be adapted to the physical constraints of printed electronics, bridging the gap between artificial intelligence and emerging hardware technologies. Since starting my PhD, I have contributed to several interdisciplinary projects, including ML4Print, MangoTune, and KI-Wasserzeichensuche, among others. Beyond my core research, I am fascinated by mathematical questions in machine learning and enjoy exploring how ML concepts can be applied to strategic reasoning in card games.
Short CV
- Since 2022 Research associate / Ph.D. candidate in Computer Science at TECO
- 2022 Master’s Degree in Artificial Intelligence and Deep Learning from the University of Alcalá
- 2020 Master’s Degree in Theoretical and Mathematical Physics from LMU/TUM
- 2016 Bachelor’s Degree in Physics from the University of Bremen
Previous Projects
- ML4Print
- ARCTUS (EUHUBS4DATA)
- MangoTune
- Fresh Satellites
- KI-Wasserzeichensuche
Research Interests
- Printed Neuromorphic Circuits
- Optimization Techniques
Projects
Topic Areas
Mathematical concepts in machine learningNeuromorphic Computing
Publications
2025
SpikeSynth: Energy-Efficient Adaptive Analog Printed Spiking Neural Networks
Pal, P.; Studt, A.; Gheshlaghi, T.; Hefenbrock, M.; Beigl, M.; Tahoori, M. B.
2025. 44th ACM/IEEE International Conference on Computer Aided Design (ICCAD 2025), Institute of Electrical and Electronics Engineers (IEEE)
Pal, P.; Studt, A.; Gheshlaghi, T.; Hefenbrock, M.; Beigl, M.; Tahoori, M. B.
2025. 44th ACM/IEEE International Conference on Computer Aided Design (ICCAD 2025), Institute of Electrical and Electronics Engineers (IEEE)
Automatic Test Pattern Generation for Printed Neuromorphic Circuits
Gheshlaghi, T.; Pal, P.; Studt, A.; Hefenbrock, M.; Beigl, M.; B. Tahoori, M.
2025. 30th IEEE European Test Symposium (ETS ’25), 6 S., Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ETS63895.2025.11049604
Gheshlaghi, T.; Pal, P.; Studt, A.; Hefenbrock, M.; Beigl, M.; B. Tahoori, M.
2025. 30th IEEE European Test Symposium (ETS ’25), 6 S., Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ETS63895.2025.11049604